Hierarchical test pattern generation using a genetic algorithm with a dynamic global reference table

The authors present a hierarchical automatic test pattern generation (ATPG) system, which searches for a compact set of test patterns, in an otherwise large search space. A genetic algorithm (GA) is employed by the system, and the search for test patterns is guided by dynamically evolving a global record table (GRT), which is the prime component for directing the search towards an optimal set of test patterns, processing elite test patterns as potential candidates for entry into the test set. The GA technique of test pattern generation was first introduced by M.J. O'Dare and T. Arslan (1994).