Measurements and Modeling of Planar Metal Film Patterns Deposited on Dielectric Substrates

Split dielectric resonator operating in a quasi TE
₀₁₁
mode was used for the measurements of resonance frequency shifts and
Q
-factor changes due to the presence of closely packed metal film circles deposited on low loss dielectric substrates. Several film patterns were investigated having various diameters of circles and made of films with different surface resistivity values. Finite difference time domain analysis of the split post dielectric resonator containing such patterns shows that closely packed metal film circles create a metamaterial with large in-plane permittivity and diamagnetic out-of-plane properties. Total losses in such a metamaterial exhibit two minima as a function of the surface resistivity of metal circles.