Experimental Study of Ground Plane Width Effect in Multilayer MCM CPW Lines

This paper describes the accurate characterization and detailed experimental study of ground width of multilayer CPW lines up to 110 GHz fabricated using photoimageable thick film technology for MCM applications. Further, the effective dielectric constant and characteristic impedance are extracted from the measured S-parameters by conversion to ABCD parameters to investigate the practical effect of ground plane width on a multilayer CPW.