Towards a test standard for board and system level mixed-signal interconnects

This paper describes basic requirements for a standard bus for testing analog interconnects. The viewpoint is that of prospective users. An architecture for such a standard bus is proposed. The basic conception is of a mixed-signal version of boundary-scan and is compatible with, indeed built upon, ANSI/IEEE Std 1149.1. The goals in mind are the detection of faults and the measurement of analog interconnect parameters. Among the desired benefits are test and test data commonality throughout an assembly hierarchy, from manufacturing to field service.<
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