An ALU-based programmable MISR/pseudorandom generator for a MC68HC11 family self-test

This paper describes an ALU-based self-test system implemented on a MC68HC11 Family microcontroller. A fully programmable pseudorandom pattern generator and multiple input signature register are used to reduce test lengths and aliasing probabilities. Design constraints and goals are described along with a detailed description of an efficient method of using the ALU to implement the self-test functions. Systems usage and burn-in applications are also described.<
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