A flexible approach to data collection for component test systems

Yield improvements for VLSI devices require data collection and analysis during the manufacturing cycle. These data should be collected in a form that satisfies the needs of those performing different functions within the factory. This paper describes an approach to data collection that focuses on collecting test data in a format customized to the users needs. Though implemented on an advanced VLSI test system, key elements of this approach can be applied to any data collection domain.<
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