SoC prototyping environment for electromagnetic immunity measurements

We present a configurable standard environment for electromagnetic (EM) immunity measurement of prototype system-on-chip (SoC). The environment is composed of two boards compliant with the 62.132-2 and 62.132-4 IEC Std Parts, being conceived for radiated and conducted measurements, respectively. The SoC under test can be prototyped on two types of ICs: two FPGAs and a microcontroller. Practical experiments have been carried out. The obtained results demonstrate the utility and benefits from using the proposed platform to estimate in an early stage of the design process the behavior of embedded systems operating in EM environment.