In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials

The unique possibilities of Current-Voltage (I-V) and Force-Displacement (F-D) curve recordings from individual 1D-nanostructures inside high-resolution transmission electron microscopes are demonstrated. The examples include Ga-filled MgO, In-filled SiO
₂
and pure multi-walled BN nanotubes.