THz tomographic imaging by using two-dimensional electro-optic sampling

A tomographic imaging system has constructed based on the two-dimensional electro-optic sampling in the reflection scheme. The imaging system is able to make a twodimensional depth scan for an area of 30 mm × 24mm with a 7-mm depth. Tomographic images obtained with this imaging system reveal the inner-structures of test samples, such as the stacked high-resistivity silicon plates, successfully.