Beam profile measurements based on light radiation of atoms excited by the particle beam

Diagnostics of intense particle beams require the development of new non-destructive beam monitoring methods. The development of a profile monitor based on beam induced fluorescence is described in this paper. Beam profile measurements under various residual gas pressure conditions and particle energies performed at the synchrotron COSY-Juelich,Germany and at the cyclotron beam transfer line at iThemba LABS,South Africa are presented and the pros and cons of the applied method is discussed.