Note on contrast measures and polynomial classifiers

The application of a contrast measure for segmenting images and the relationship of this method to polynomial-based classification are considered. The relevance of the segmentation method is shown by applying the contrast measure to a semiconductor manufacturing inspection problem. The contrast measure is shown to be a particular case of a pixel classification technique based on polynomial decision functions and local texture features. This relationship integrates an important heuristic method with the rigorous theory of decision-theoretic classification.<
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