New Approach Based on Double-Crossed Step-down-Stress Accelerated Life Testing

New approach based on DCSDS-ALT which is a reverse process of traditional DCSUS-ALT is introduced. Procedure of this method is given, and numeral example is shown. Conclusions are that though DCSDS-ALT is not always better than DCSUS-ALT, its effect in improving testing efficiency is obvious when some product parameter reaches to certain value. For high reliability long lifetime test, this condition usually can be satisfied, so it is applicable.