Thermal Boundary Resistance in Optoelectronic Devices

A state-of-the-art electro-optical-thermal simulation tool is enhanced to include the effect of phonon reflections at epitaxial interfaces. A detailed numerical investigation of the alteration in electron/hole/phonon scattering rates and heat fluxes due to the thermal boundary resistance at hetero-junctions and epitaxial interfaces is carried out. The heat flux in a 1.3μm edge-emitting laser and through VCSEL mirrors is considered. An increase in QW temperature within the edge-emitting laser of up to 0.3K is observed.