A Neutron Irradiation Test of Germanium Bicrystals

A neutron radiation test was performed on 12 germanium bicrystals of four different resistivities, to screen their radiation tolerance. Optical performance of four bicrystals was recorded intermittently during the test using a pulsed radiation-tolerant light source included in the test package. VI diode characteristics were also taken periodically throughout the test. The results obtained showed that the open circuit voltage response of the devices was degraded by 5 × 1013 nvtf and that their diode characteristics became linear in proportion to the donor concentration. The diode characteristics, however, were affected at a much lower value than anticipated, as shown by the zero bias conductance.