A Comparison of Very Fast to Very Slow Components in Degradation and Recovery Due to NBTI and Bulk Hole Trapping to Existing Physical Models

A new measuring technique with a 1mus measuring delay and a direct V
_T
determination has been employed. The response to stress times as short as 100 mus to 10
⁵
has been studied as well as recovery over 12 decades in time. These experimental data allow a meaningful comparison to theory. Degradation data cut be precisely fitted to a simple physical model with 3 parameters thus enabling a reliable lifetime prediction from stress times below 10
⁴
s.