Reduction of Ru Interlayer Thickness for CoCrPt-SiO2 Perpendicular Recording Media

In this paper, a CoCrPt-SiO
₂
based recording media with reduced Ru interlayer thickness was investigated. The Ta seedlayer, Ru interlayer and magnetic layer were deposited by DC magnetron sputtering on cover glass substrates. Magnetic properties were tested using a vibrating sample magnetometer; interface morphology was examined by X-ray reflectivity and atomic force microscopy; and film orientation and microstructure were evaluated by X-ray diffraction and transmission electron microscopy.