Correlation of rf-response and domains in patterned ferromagnetic films

The correlation between rf-response and magnetic microstructure is addressed in this paper. Patterned arrays with rectangular elements of an amorphous Co
₉₂
Zr
₂
Ta
₆
(CZT) alloy were fabricated from single layers (thickness 80 nm) and CZT (40 nm)/Al
₂
O
₃
(4 nm)/CZT(40 nm) trilayers. The elements have an induced uniaxial anisotropy along their short axis. The rf-response of the arrays was characterized by pulsed inductive microwave magnetometry and directly compared to the properties of un-patterned films. The corresponding magnetic domain structure was analyzed by quasi-static and picosecond time-resolved wide-field Kerr microscopy in the longitudinal mode.