Comparison Between Novel Very Wideband Network Analyzer Calibration Techniques and the TRL Method

Very wideband Through-Attenuate-Reflect (TAR) and Through-Attenuate-Network (TAN) methods, suitable for RF probing, are developped in detail, and their performance studied with regard to practical limits in the the standards used. The methods are applied to the deembedding of a thin-film miniaturised hybrid microwave integrated circuit capacitor and a HEMT chip and the results obtained compared with those acheived using the Through-Reflect-Line (TRL) calibration method.