Automated test data development for semi-custom ICs: An ideal approach to fast development

With the advent of high performance technologies (sub-micron CMOS, BiCMOS, and BiNMOS), the practicality of automated test data development will be emphasized. Although automatic test pattern generation and timing analysis are currently considered desirable, the complexity and size of future ICs will make them mandatory. The author describes a new trend in test data development for a complex semi-custom IC and the benefits of that methodology through the development of an ASSP (application specific standard product).<
>