ESD Susceptibility of Thick Film Chip Resistors by Means of Transmission Line Pulsing

The change in resistance (dR) due to an applied high voltage pulse is a measure of the electrostatic discharge susceptibility of a resistor. The influence of the pulse width and height on the susceptibility was investigated on thick film chip resistors of different values and sizes. By means of the transmission line pulsing technique (TLP), the ESD behaviour of thick film chip resistors is presented.