Multi-Mode Segmented Scan Architecture with Layout-Aware Scan Chain Routing for Test Data and Test Time Reduction

This paper presents multi-mode segmented scan architecture. Three operation modes are supported: broadcast, multicast, and serial. Efficient test data compression can be achieved under this architecture with limited hardware overhead. An efficient two-way partitioning algorithm is given to construct multicast-mode configurations. Finally, we present a layout-aware scan chain routing for test compaction, which has not yet explored by the researchers. Experimental results show that most of the serial scan operations can be replaced by multicast operations, and thus achieve much better compression rate