Fault diagnosis in ATE's analog circuit modules with the aid of parameter estimation method

The author presents a parameter estimation approach embedded in the host computer of automatic test equipment (ATE) for fault diagnosis of analog equipment in the time domain. The aim is to use dynamic models to enable the estimation of all components of analog circuit modules which are influenced by faults. This method provides ATEs analog circuit modules with a self-test diagnostic by aid using existing interface cards, switching units, and host computer without additional test equipment. Examples show the advantages of the proposed method implemented into an automatic test system.<
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