S-SEED operation with noise: bit error rate analysis

The static and dynamic noise characteristics of a symmetric self electrooptic effect device (S-SEED) are studied. The mechanism for bit errors is identified, and the bit error rate related to the decision threshold, input contrast ratio, nominal input power, and bit activation period. Dynamic simulations use practical S-SEED parameters for the diode capacitance, bias voltage, and responsivity values to show specific examples; however, the bit error rate curves provide general results since these parameters are allowed to be variables. The probability of abnormal operation, when there is distortion or an error in the output, is also derived and can be directly related to the bit error rate. In a practical S-SEED switching environment example, we show that the noise effect results in a probability of abnormal operation to be less than 10/sup -50/ provided the bit activation period exceeds the switching time by 0.5%.<
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