Timing accuracy in VLSI testing

Timing errors arising during VLSI device testing are reviewed. Particular attention is given to internal tester errors caused by the characteristics of the hardware and the autocalibration procedure used, and application-related errors in DC testing, function testing, and AC testing (testing of dynamic parameters). It is concluded that extremely expensive testers or testers highly geared to specific characteristics are not necessarily the most economical or most cost-effective solution, not even for standard applications.<
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