The characterisation of embedded analogue to digital converters

An original technique which eases the testing problems associated with embedded in silicon analogue to digital converters (ADCs) is presented. Theoretical and practical results are used to demonstrate the principles where a relationship has been developed between histogram and signal to noise ratio (SNR) data by way of an ADC model. A variable Delta /sub j/ is presented which may be used to characterise ADCs without creating vast amounts of data.<
>