A novel algorithm for the restoration of AFM/STM images

Images generated from the scanning tunneling microscope (STM) or atomic force microscope (AFM) imaging system can show microstructures of samples. However, resulting AFM/STM images are sometimes corrupted by streaks. Thus, to suppress such streaks becomes an important task in the processing of AFM/STM images. We analyze the generation of streaks, introduce a degradation model of the corrupted AFM/STM image, and then propose an adaptive notch filtering algorithm to remove the streaks. Some simulation results support the analysis and indicate the performance of the proposed algorithm.<
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