Statistical circuit simulation and yield analysis for IC's

The importance of running statistically based process, device and circuit simulations is becoming critical to IC design for manufacturing techniques. Thus arises the need for software-based packages that couple statistical techniques to conventional simulators. Monte Carlo techniques have been implemented in various such packages, but the nature of Monte Carlo designs often lead to time-consuming and inefficient techniques. This paper concentrates on coupling more efficient statistical techniques (based on a Design of Experiments methodology) and conventional simulators with the aid of software tools for the purpose of characterizing circuit performances in terms of equipment and material variables.<
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