Technique for measurements of semiconductor devices between 2 and 300 K

A computer-controlled test measurement setup that permits full automatic acquisition of device characteristics in the temperature range from 2 to 300 K is described. The required equipment, the special construction of a suitable cold work area inside of a helium dewar, and a typical cooling procedure are discussed in detail. Typical measurement data give an idea of the studies of device behaviour versus temperature that are possible with the test assembly.<
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