Complete test set for multiple-valued logic networks

A complete test set (CTS) is defined and derived for multiple-valued logic (MVL) Min/Max networks. The CTS can detect any single and multiple stuck-at faults of the MVL Min/Max network regardless of its implementation. Two splitting algorithms to generate the CTS or a given MVL function are proposed. One algorithm demonstrates over 2 orders speed improvement and 3 orders memory savings and the other algorithm demonstrates over 4 orders speed improvement and 2 orders memory savings with respect to the conventional truth table enumerating method.<
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