An approach for online repair and yield enhancement of VLSI/WSI redundant memories

A novel approach to yield enhancement of VLSI/WSI memories by row/column repair is presented. This approach is based on an online technique which executes concurrently with the testing process. The proposed repair approach consists of a divide-and-conquer strategy in which the overall fault pattern is divided into partitions. This is based on two practical considerations: the occurrence of faulty clusters and the practice of dividing a large memory into smaller subarrays (partitions) for speeding up the process of finding the overall repair-solution.<
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