Test generation of C-testable array dividers

The design of C-testable array dividers that are tested with a test set of constant length irrespective of the circuit size is presented. The results show that the proposed designs of n-by-n nonrestoring and restoring array dividers are C-testable and can be fully tested using only 20 and 40 test patterns, respectively. Algorithms that generate the test patterns and expected outputs are also provided.<
>