Particle LET spectra from microelectronics packaging materials subjected to neutron and proton irradiation

Cumulative fractions for linear energy transfer spectra were measured for particles ejected from microelectronics packaging materials subjected to neutron and proton irradiations. The measurements for the neutron irradiations compare well with Monte Carlo theoretical calculations. The spectra can be used to access microelectronics vulnerabilities in strategic-nuclear-weapon, space-trapped, and neutral-beam directed-energy particle environments.<
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