Automatic characterization and modeling of microwave low noise HEMTs

An automated measuring system is presented which allows the simultaneous characterization of microwave transistors in terms of noise and scattering parameters by means of noise figure measurements only. Very low time consumption, repeatability and accuracy characterize the system. The setup is driven by original software which selects the best measuring conditions for accuracy and performs the measurements and data processing routines without any action on the part of the operator. The testing of 32 samples of HEMTs in the 8-12 GHz frequency range is accomplished before and after 300 h of storage at 200 degrees C. The model of the typical device of each series is extracted by means of the noise and scattering parameter sets which have been obtained.<
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