Transverse scattering matrix formulation for a class of waveguide eigenvalue problems

Based on the mode-matching procedure, a unified transverse scattering matrix formulation is presented for the characterization of a class of waveguide eigenvalue problems, which include not only closed but also open structures. As examples, calculations are carried out on the dispersion characteristics of ridged waveguides and their variations, nonradiative dielectric (NRD) waveguides, groove guides, microstrip lines, finlines and coplanar waveguides. Comparisons with published data are made and verify the versatility and accuracy of the method. Besides its generality, this approach is also superior to some other techniques in simplicity and numerical efficiency.<
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