Finite element modeling of electrode-skin contact impedance in electrical impedance tomography

In electrical impedance tomography (EIT), the measured voltages are sensitive to electrode-skin contact impedance because the contact impedance and the current density through it are both high. Large electrodes were used to provide a more uniform current distribution and reduce the contact impedance. A large electrode differs from a point electrode in that it has shunting and edge effects that cannot be modeled by a single resistor. The finite-element method (FEM) was used to study the electric field distributions underneath an electrode, and three models were developed: a FEM model, a simplified FEM model, and a weighted load model. The FEM models considered both shunting and edge effects and closely matched the experimental measurements. It is concluded that FEM models of electrodes can be used to improve the performance of an electrical impedance tomography reconstruction algorithm.<
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