A method of shuffling compactor inputs in VLSI self-testing

Shuffling interconnections between CUT outputs and the output response compactor inputs is proposed as a scheme to decrease aliasing probability. A spot error is defined as a multiple bit error adjacent in space and in time. The condition for preventing aliasing for a predetermined size of single spot error is presented. Block based shuffling and the shortened one are proposed to realize the required distance properties. The effect of shuffling against multiple spot errors is investigated by simulation.<
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