Electro-optic sampling of gallium arsenide integrated circuits

Short optical pulses are used in a time-delay-sampling arrangement to measure electrical fields via the electro-optic effect. The choice of the electro-optic crystal, of the source of short optical pulses and of the geometry of the optical/electrical interaction allows flexibility in experimental set-up and in the type of electrical waveform to be measured. The authors have selected a very flexible configuration to allow the test of microwave integrated circuits using electronic synchronisation.<
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