Self-test of timing and control circuitry

Large, state-of-the-art electronic systems require the generation of many timing and control signals. These signals typically emanate from a subsystem dedicated to this timing and control function. Since this subsystem is a primary controller of system operation, it is important to be able to test it effectively. Increased testability requirements in this area have created a need for more effective ways of testing this circuitry. Two proven methods for testing timing and control subsystems are reported. The methods involve the use of a built-in logic analyzer for data compression. Emphasis is on the attributes of each with respect to cost, complexity, and effectiveness.<
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