Bridging fault algorithms for a boundary scan board

Although the introduction of boundary scan reduces the need for in-circuit testing via a bed-of-nails fixture, the time taken to load a test vector serially places a new premium on minimising the number of test vectors. In addition, net testing via a boundary scan has to rely on detecting standard voltage level changes rather than the resistance-related tests possible with in-circuit testing. This paper examines these problems in the context of net bridging faults and describes efficient detection and diagnosis algorithms based on a Pin-Adjacency fault model.<
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