A custom hybrid GaAs driver and sensor device for a high-speed test system

A customized hybrid GaAs device has been designed and prototyped that can operate from DC to 100 MHz and above, interface directly with ECL (emitter-coupled logic), TT (transistor-transistor logic), and CMOS components, and handle both the in-circuit and device testing environments. The circuits for both the driver and sensor are delineated, and some of the design issues are discussed. The prototyping of the design into a hybrid IC is explained and experimental performance results are presented.<
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