Dual die Pentium D package technology development

This paper describes the technology development for packaging two identical CPU die on one package. Historically, processors involved packaging one die on a package, but with higher performance demands, multiple die products have become necessary. With existing single core die designs, packaging two die in one unit provides a novel way of producing a dual core CPU without designing new silicon. This paper starts with the evolution of dual core CPU from use of two die joined to each other to separate die placed next to each other to the final form of two die placed with a gap. The land grid array (LGA) package technology development was done within the boundary conditions of reuse of existing sockets and enabling solutions. It involved use of higher layer count substrates to allow routing of two die to pre-existing pin-out, modified IHS to accommodate two die in a limited space, and die side components for helping power delivery. The paper describes the details of the substrate technology, routing options and design rules to meet the dual die package requirements that include product performance, substrate manufacturing and assembly and test. The test vehicle definition and design of different structures are described that are new for the dual die scenario. Also limitations based upon compatibility requirements for test lead to creative implementations of those test vehicle structures. The IHS design modifications implemented to fit the two die and to maintain the over all package stack-up are described. Routing and power delivery methodologies in the dual die package architecture are described. Discussed also are how substrate design rules, & collaterals and design process changed and adjusted to the move from a single die to two. The paper then focuses on the multiple challenges faced by the assembly and reliability areas. Single chip package versus dual chip package mechanical stresses are compared. Assembly areas of chip attach, under-fill, and IHS attach are described. The process design rules for UF in dual die case are new compared with the single die case. The challenges of IHS attach and TIM process (including thicknesses) for the two separate die are addressed. Specific challenges encountered for multi-chip packages (MCP) include application of chip attach flux, removal of flux after chip attach as well as voids formed at the TIM to IHS interface. Finally, thermal performances of the dual die package are presented and compared with that of a single die package. The thermal definitions and measurement methods for the dual die package are shown with equivalents to single die case. The thermal benefits of a dual die package prove the advantages of a dual die package in terms of product performance with respect to power dissipation. The future directions of the dual die technology based on the new products on the roadmap are discussed along with some potential areas of focus in the next generation dual die packages.