Measurements and performance of a microstrip beam probe system

Microstrip probes and associated processing electronics have been designed and used to measure charged-beam position, angle, intensity, output phase, and energy. The authors describe the system that uses the probes and discuss typical beam-cavity interaction data, measurement errors, and system performance. As a bunched, charged beam periodically passes through a microstrip probe, a bipolar signal proportional to the beam's current and position is induced into each of the probe's four axial symmetric lobes. Processing electronics and computer algorithms transform two probe signals into beam intensity and into centroids of the six-dimensional, phase-space beam distributions. These beam centroids can then be plotted with cavity data so that output beam characteristics can be expressed as a function of cavity power and phase.<
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