Yield evaluation of WSI parallel systems

The authors propose a methodology for estimating the yield of WSI (wafer scale integration) parallel systems efficiently and accurately by taking advantage of the fact that most of the parallel systems have recursive structures by nature. This methodology evaluates yield by means of a recursive approach without enumerating all fixable states. It is often possible to derive the yield of WSI parallel systems (with recursive structures) of any size. Using this approach, the authors evaluate the exact yield of a fault-tolerant modular binary tree and the yield bounds of a reconfigurable cube-connected cycle structure.<
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