Terahertz surface and interface characterization

We describe our recent work on various all-optoelectronic imaging systems for the terahertz frequency range and outline their application for surface and interface characterization. Our systems are based either on pulsed or continuous-wave techniques, and they operate both in reflection and transmission geometry. Dark-field techniques are implemented in order to increase the sensitivity to diffraction and scattering effects. Possible application areas of THz imaging in the biomedical field as well as in surface and interface characterization for industrial purposes are explored.