New method of measurement of diode junction parameters

An experimental technique for measuring the two parameters i
0
and n of the diode equation
i=i_{0}[\exp (qV/nkT)-1]
has been developed. The technique consists of determining n from the ratio of two average currents resulting from two sine waves being impressed-across the diode. Then the value of n is used to determine an amplitude of sine wave to relate i
0
to the average current through a simple multiple. The values of n and i
0
obtained by this method were compared with the same quantities obtained from the slope and intercept of a log i versus v plot. Standard deviation between methods of measuring n was 0.028. Standard deviation between methods of measuring log i
0
was 0.01.