Magnetic and electronic properties of Fe/sub 1.2/Ti/sub 0.8/O/sub 3//Fe/sub 2/O/sub 3/ bilayered films

Bilayered films of Fe/sub 1.2/Ti/sub 0.8/O/sub 3//Fe/sub 2/O/sub 3/ were prepared on /spl alpha/-Al/sub 2/O/sub 3/(001) single-crystalline substrate using reactive sputtering technique. The magnetic and electronic properties of the films were characterized by X-ray diffraction (XRD), conversion electron Mossbauer spectroscopy (CEMS), vibrating sample magnetometer (VSM) and X-ray photoelectron spectroscopy (XPS).