Parametric modeling of integrated circuit interconnections

A parametric approach to the modeling and characterization of high frequency losses and dispersive propagation on integrated-circuit (IC) interconnections is presented. An autoregressive moving-average (ARMA) model based on a lumped equivalent circuit of a lossy microstrip transmission line is proposed. Model parameters are estimated from on-wafer time-domain measurements using a weighted least squares (WLS) algorithm and an Elmore delay approximation technique. It is shown that the effective microstrip permittivity can be evaluated from the estimated ARMA model parameters. Experiment results are compared with computer simulations of the lumped equivalent circuit and ARMA parametric models.<
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