Multiple fault testing of logic resources of SRAM-based FPGAs

We present a simple but useful method which detects all multiple stuck-at faults in the application and configuration inputs of LUTs. A novel method for testing of stuck-at faults at control bits of flip flops has also been proposed. The aim is to integrate testing of LUTs, flip flops and multiplexers which reduces the number of configurations and hence minimize the testing time.