Analysis of time-dependent white defects in PSID imagers

A novel white defect phenomenon, time-dependent white defect (TDWD), exclusively observed in 2-million-pixel photoconductive-layered solid-state image sensors has been studied. Experimental results and analytical models show that TDWDs are caused by Fowler-Nordheim injection of electrons through the oxide under the taper-etched cathode interface regions in vertical CCD registers.<
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