An evaluation of built-in vs. off-chip strategies for online transient current testing

We evaluate the possibilities of transient current testing practical implementation by comparing the transient supply current signature at the external circuit supply pins to its internal behavior. To do this we develop and analyze a hierarchical power-grid equivalent circuit to evaluate the supply current frequency components and their distribution over the power/ground grid hierarchy. This is a key step to determine the feasibility of on-chip vs. off-chip idd(t) strategies and their successive application to online testing.